atomic force microscopy

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Scope note
A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system.
atomic force microscopy
Accepted term: 15-Jul-2024