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Auger electron spectroscopy


Identification code: 300390575



Alternative term/s

  • AES
  • SAM
  • scanning Auger microscopy
  • spectroscopy, Auger electron

Anotations

Scope note:

Sensitive surface analytical technique that measures secondary electrons excited by an incident electron beam. This technique is used to determine elemental composition of the top few nanometers of solid, electrically conductive materials.

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