<?xml version="1.0" encoding="utf-8"?><metadata xmlns:dc="http://purl.org/dc/elements/1.1/"  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/"><dc:title xml:lang="en">spectroscopic ellipsometry</dc:title><dc:identifier>http://AATesaurus.cultura.gencat.cat/aat/getty_en?tema=31317212</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="en">Getty Institute</dc:publisher><dcterms:created>2026-03-30 20:25:25</dcterms:created><dcterms:isPartOf xsi:type="dcterms:URI">http://AATesaurus.cultura.gencat.cat/aat/getty_en</dcterms:isPartOf><dcterms:isPartOf xml:lang="en">Tesaurus d&apos;Art i Arquitectura</dcterms:isPartOf><dc:format>text/html</dc:format> <dcterms:alternative xml:lang="en">SE</dcterms:alternative> <dcterms:alternative xml:lang="en">ellipsometry, spectroscopic</dcterms:alternative> <dc:description xml:lang="en"><![CDATA[ A nondestructive, noninvasive optical technique used to test the dielectric properties of thin films. Spectroscopic ellipsometry (SE) employs broadband light sources to measure refractive index, absorption coefficient, and film thickness from the polarization characteristics of linearly polarized incident light reflected from the sample's surface. ]]></dc:description></metadata>