<?xml version="1.0" encoding="utf-8"?><metadata xmlns:dc="http://purl.org/dc/elements/1.1/"  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/"><dc:title xml:lang="en">atomic force microscopy</dc:title><dc:identifier>http://AATesaurus.cultura.gencat.cat/aat/getty_en?tema=31317239</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="en">Getty Institute</dc:publisher><dcterms:created>2026-03-30 20:25:26</dcterms:created><dcterms:isPartOf xsi:type="dcterms:URI">http://AATesaurus.cultura.gencat.cat/aat/getty_en</dcterms:isPartOf><dcterms:isPartOf xml:lang="en">Tesaurus d&apos;Art i Arquitectura</dcterms:isPartOf><dc:format>text/html</dc:format> <dcterms:alternative xml:lang="en">AFM</dcterms:alternative> <dcterms:alternative xml:lang="en">microscopy, atomic force</dcterms:alternative> <dc:description xml:lang="en"><![CDATA[ A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system. ]]></dc:description></metadata>