<?xml version="1.0" encoding="utf-8"?><metadata xmlns:dc="http://purl.org/dc/elements/1.1/"  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/"><dc:title xml:lang="en">scanning electron microscopes</dc:title><dc:identifier>http://AATesaurus.cultura.gencat.cat/aat/getty_en?tema=31443938</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="en">Getty Institute</dc:publisher><dcterms:created>2026-03-30 20:59:37</dcterms:created><dcterms:isPartOf xsi:type="dcterms:URI">http://AATesaurus.cultura.gencat.cat/aat/getty_en</dcterms:isPartOf><dcterms:isPartOf xml:lang="en">Tesaurus d&apos;Art i Arquitectura</dcterms:isPartOf><dc:format>text/html</dc:format> <dcterms:alternative xml:lang="en">microscope, scanning electron</dcterms:alternative> <dcterms:alternative xml:lang="en">scanning electron microscope</dcterms:alternative> <dc:description xml:lang="en"><![CDATA[ Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam. ]]></dc:description></metadata>