<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">ion beam analysis</topic></authority><related type="narrower"><topic>Rutherford backscattering spectroscopy</topic></related><related type="narrower"><topic>nuclear reaction analysis</topic></related><related type="narrower"><topic>ion beam induced luminescence</topic></related><related type="broader"><topic>analysis and testing techniques</topic></related><variant type="other"><topic>IBA</topic></variant><variant type="other"><topic>analysis, ion beam</topic></variant> <note xml:lang="en"><![CDATA[ Refers to analysis of materials on a microscopic or macroscopic scale using a beam of positively charged light ions. Ion beam analysis (IBA) techniques are often used to study works of art,  because of their noninvasive and nondestructive character. These techniques exploit the products of interactions between beams of accelerated charged particles and the target in order to determine its elemental composition. ]]></note></mads>