<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">secondary ion mass spectrometry</topic></authority><related type="broader"><topic>mass spectrometry</topic></related><variant type="other"><topic>SIMS</topic></variant><variant type="other"><topic>spectrometry, secondary ion mass</topic></variant> <note xml:lang="en"><![CDATA[ A form of mass spectrometry commonly used for surface analysis. When a primary beam of accelerated ions strikes a solid surface, secondary ions are among the elements displaced in a process called sputtering. These ions may be directly studied to gain information about the target material. ]]></note></mads>