<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">electronic speckle pattern interferometry</topic></authority><related type="broader"><topic>interferometry</topic></related><variant type="other"><topic>ESPI</topic></variant><variant type="other"><topic>interferometry, electronic speckle pattern</topic></variant> <note xml:lang="en"><![CDATA[ Refers to an optical technique which enables interferometric measurements of surface displacements. When laser light is scattered by a rough surface it generates a random intensity distribution known as a speckle pattern.The technique allows visualization and measurement of the three dimensional distribution of displacement and strain/stress on the object.  ]]></note></mads>