<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">test scoring devices</topic></authority><related type="broader"><topic>data processing devices</topic></related><variant type="other"><topic>devices, test scoring</topic></variant><variant type="other"><topic>test scoring device</topic></variant><variant type="other"><topic>test scoring machines</topic></variant> <note xml:lang="en"><![CDATA[ Devices that calculate or tabulate test scores. An early example was IBM’s “Test Scoring Machine” developed in 1928, which used the electrical conductivity of graphite pencil marks to interpret correct and incorrect answers. ]]></note></mads>