<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">scanning electron microscopes</topic></authority><related type="other"><topic>scanning electron microscopy</topic></related><related type="broader"><topic>electron microscopes</topic></related><variant type="other"><topic>microscope, scanning electron</topic></variant><variant type="other"><topic>scanning electron microscope</topic></variant> <note xml:lang="en"><![CDATA[ Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam. ]]></note></mads>