<?xml version="1.0" encoding="utf-8"?><mads xmlns="http://www.loc.gov/mads/" xmlns:mods="http://www.loc.gov/mods/v3" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/mads/
mads.xsd"><authority><topic authority="http://AATesaurus.cultura.gencat.cat/aat/getty_en">total reflection x-ray fluorescence</topic></authority><related type="broader"><topic>x-ray fluorescence</topic></related><variant type="other"><topic>TXRF</topic></variant><variant type="other"><topic>fluorescence, total reflection x-ray</topic></variant><variant type="other"><topic>total reflection x-ray fluorescence</topic></variant><variant type="other"><topic>total reflection x-ray fluorescence spectrometry</topic></variant> <note xml:lang="en"><![CDATA[ Surface elemental analysis technique widely used for identification and characterization of pigments in conservation science. It is an x-ray fluorescence technique in which an incident beam strikes a sample below the critical angle of external total reflection for X-rays resulting in nearly total reflection of the excitation beam photons. ]]></note></mads>