Tesaurus d'Art i Arquitectura Getty Institute 0000-00-00 2024-01-24 15:40:44 en spectroscopic ellipsometry300389953ellipsometry, spectroscopicSE A nondestructive, noninvasive optical technique used to test the dielectric properties of thin films. Spectroscopic ellipsometry (SE) employs broadband light sources to measure refractive index, absorption coefficient, and film thickness from the polarization characteristics of linearly polarized incident light reflected from the sample's surface. spectroscopic ellipsometry (traducció pendent) spectroscopic ellipsometry (traducció pendent) 2026-03-30 20:25:25