Tesaurus d'Art i Arquitectura Getty Institute 0000-00-00 2024-01-24 15:40:44 en Auger electron spectroscopy300390575AESSAMscanning Auger microscopyspectroscopy, Auger electron Sensitive surface analytical technique that measures secondary electrons excited by an incident electron beam. This technique is used to determine elemental composition of the top few nanometers of solid, electrically conductive materials. Auger electron spectroscopy (traducció pendent) espectroscòpia d'electrons Auger 2026-03-30 20:32:03