<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31304542</termId><termName>interferometry</termName><termType>PT</termType><termNote><![CDATA[ The use of an optical interferometer for a wide variety of metrological and spectroscopic applications that study the interference pattern (or "fringe") established when a single beam of light multiply divided into beams traveling unequal paths is reunited. ]]></termNote><termCreatedDate>2026-03-30 20:21:54</termCreatedDate><relation><relationType>BT</relationType><termId>31298665</termId><termName>analysis and testing techniques</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31317488</termId><termName>laser Doppler vibrometry</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31317491</termId><termName>holographic interferometry</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31317495</termId><termName>electronic speckle pattern interferometry</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31317498</termId><termName>shearography</termName><termType>PT</termType></relation></term>  </Zthes>