<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31308486</termId><termName>x-ray diffraction</termName><termType>PT</termType><termNote><![CDATA[ Diffraction of x-rays by the regularly spaced atoms of a substance, useful for determining the arrangement of atoms and thereby the nature or composition of a substance. ]]></termNote><termCreatedDate>2026-03-30 20:23:03</termCreatedDate><relation><relationType>UF</relationType><termId>31308487</termId><termName>XRD</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31308488</termId><termName>x ray diffraction</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31299841</termId><termName>diffraction</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31327409</termId><termName>x-ray powder diffraction</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31327413</termId><termName>micro x-ray diffraction</termName><termType>PT</termType></relation></term>  </Zthes>