<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31317239</termId><termName>atomic force microscopy</termName><termType>PT</termType><termNote><![CDATA[ A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system. ]]></termNote><termCreatedDate>2026-03-30 20:25:26</termCreatedDate><relation><relationType>UF</relationType><termId>31317240</termId><termName>AFM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317241</termId><termName>microscopy, atomic force</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31304399</termId><termName>microscopy</termName><termType>PT</termType></relation></term>  </Zthes>