<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31317306</termId><termName>particle-induced x-ray emission</termName><termType>PT</termType><termNote><![CDATA[ A technique of elemental analysis in which a small area on a surface is bombarded with charged particles (non-electrons, usually protons) to produce fluorescent X-rays specific to an element. The method is used in conservation science, archaeology, and geology to obtain an elemental map which may guide research regarding dating, provenance and authenticity. ]]></termNote><termCreatedDate>2026-03-30 20:25:27</termCreatedDate><relation><relationType>UF</relationType><termId>31317307</termId><termName>PIXE</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317308</termId><termName>particle-induced x-ray emission analysis</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317309</termId><termName>proton-induced x-ray emission</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317310</termId><termName>x-ray emission, particle-induced</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31304411</termId><termName>spectroscopy</termName><termType>PT</termType></relation></term>  </Zthes>