<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31317440</termId><termName>secondary ion mass spectrometry</termName><termType>PT</termType><termNote><![CDATA[ A form of mass spectrometry commonly used for surface analysis. When a primary beam of accelerated ions strikes a solid surface, secondary ions are among the elements displaced in a process called sputtering. These ions may be directly studied to gain information about the target material. ]]></termNote><termCreatedDate>2026-03-30 20:25:28</termCreatedDate><relation><relationType>UF</relationType><termId>31317441</termId><termName>SIMS</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317442</termId><termName>spectrometry, secondary ion mass</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31304443</termId><termName>mass spectrometry</termName><termType>PT</termType></relation></term>  </Zthes>