<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31317495</termId><termName>electronic speckle pattern interferometry</termName><termType>PT</termType><termNote><![CDATA[ Refers to an optical technique which enables interferometric measurements of surface displacements. When laser light is scattered by a rough surface it generates a random intensity distribution known as a speckle pattern.The technique allows visualization and measurement of the three dimensional distribution of displacement and strain/stress on the object.  ]]></termNote><termCreatedDate>2026-03-30 20:25:29</termCreatedDate><relation><relationType>UF</relationType><termId>31317496</termId><termName>ESPI</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317497</termId><termName>interferometry, electronic speckle pattern</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31304542</termId><termName>interferometry</termName><termType>PT</termType></relation></term>  </Zthes>