<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31317688</termId><termName>electron backscatter diffraction</termName><termType>PT</termType><termNote><![CDATA[ Application of electron diffraction in the backscattering mode as used in analysis of crystallographic structure of textured materials that show a preferred orientation of crystalline components. Electron backscatter diffraction (EBSD) is based on the measurement of the diffraction pattern formed by the electrons backscattered toward a phosphor screen positioned at an angle from the sample surface. The visible lines generated by the impinging electrons are called Kikuchi bands; thus the technique is also known as backscatter Kikuchi diffraction (BKD).  ]]></termNote><termCreatedDate>2026-03-30 20:25:32</termCreatedDate><relation><relationType>UF</relationType><termId>31317689</termId><termName>BKD</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317690</termId><termName>EBSD</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317691</termId><termName>backscatter Kikuchi diffraction</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31317692</termId><termName>diffraction, electron backscatter</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31304694</termId><termName>backscattering</termName><termType>PT</termType></relation></term>  </Zthes>