<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31327409</termId><termName>x-ray powder diffraction</termName><termType>PT</termType><termNote><![CDATA[ Technique applying x-ray diffraction to crystalline or powder samples in order to ascertain their structure. ]]></termNote><termCreatedDate>2026-03-30 20:28:14</termCreatedDate><relation><relationType>UF</relationType><termId>31327410</termId><termName>XRPD</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31327411</termId><termName>diffraction, x-ray powder</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31327412</termId><termName>powder x-ray diffraction</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31308486</termId><termName>x-ray diffraction</termName><termType>PT</termType></relation></term>  </Zthes>