<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31341265</termId><termName>scanning electron microscopy</termName><termType>PT</termType><termNote><![CDATA[ The activity of using a scanning electron microscope, which is designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy. ]]></termNote><termCreatedDate>2026-03-30 20:32:02</termCreatedDate><relation><relationType>UF</relationType><termId>31341266</termId><termName>SEM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341267</termId><termName>electron microscopy, scanning</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341268</termId><termName>microscopy, scanning electron</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31317221</termId><termName>electron microscopy</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31372101</termId><termName>scanning transmission electron microscopy</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31372104</termId><termName>field-emission scanning electron microscopy</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31372109</termId><termName>environmental scanning electron microscopy</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31443938</termId><termName>scanning electron microscopes</termName><termType>PT</termType></relation></term>  </Zthes>