<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31341269</termId><termName>transmission electron microscopy</termName><termType>PT</termType><termNote><![CDATA[ A form of electron microscopy in which the electron beam passes through a very thin sample, deflecting or scattering some of the electrons which are focused by magnetic lenses onto a screen or photographic plate. The technique is used to visualize the interior structure of such specimens as cells and tissues. ]]></termNote><termCreatedDate>2026-03-30 20:32:02</termCreatedDate><relation><relationType>UF</relationType><termId>31341270</termId><termName>TEM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341271</termId><termName>microscopy, transmission electron</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31317221</termId><termName>electron microscopy</termName><termType>PT</termType></relation><relation><relationType>NT</relationType><termId>31372101</termId><termName>scanning transmission electron microscopy</termName><termType>PT</termType></relation></term>  </Zthes>