<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31341323</termId><termName>x-ray excited optical luminescence</termName><termType>PT</termType><termNote><![CDATA[ An X-ray spectroscopy technique, usually synchrotron-based, that provides information on the chemical state and short-range atomic order of the top few microns of a surface. It concerns the conversion of the X-ray energy absorbed by the system to optical photons often involving multi-step cascade processes. XEOL is often used together with XANES/NEXAFS to provide site specificity which in turn can help reveal the electronic structure and optical properties of the system of interest.  ]]></termNote><termCreatedDate>2026-03-30 20:32:03</termCreatedDate><relation><relationType>UF</relationType><termId>31341324</termId><termName>XEOL</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31317272</termId><termName>x-ray spectroscopy</termName><termType>PT</termType></relation></term>  </Zthes>