<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31341372</termId><termName>Auger electron spectroscopy</termName><termType>PT</termType><termNote><![CDATA[ Sensitive surface analytical technique that measures secondary electrons excited by an incident electron beam. This technique is used to determine elemental composition of the top few nanometers of solid, electrically conductive materials. ]]></termNote><termCreatedDate>2026-03-30 20:32:03</termCreatedDate><relation><relationType>UF</relationType><termId>31341373</termId><termName>AES</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341374</termId><termName>SAM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341375</termId><termName>scanning Auger microscopy</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31341376</termId><termName>spectroscopy, Auger electron</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31317311</termId><termName>emission spectroscopy</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31341365</termId><termName>atomic emission spectroscopy</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31341377</termId><termName>electron energy loss spectroscopy</termName><termType>PT</termType></relation></term>  </Zthes>