<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31372101</termId><termName>scanning transmission electron microscopy</termName><termType>PT</termType><termNote><![CDATA[ Electon scanning microscopy using a focused beam.  ]]></termNote><termCreatedDate>2026-03-30 20:40:21</termCreatedDate><relation><relationType>UF</relationType><termId>31372102</termId><termName>STEM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31372103</termId><termName>microscopy, scanning transmission electron</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31341265</termId><termName>scanning electron microscopy</termName><termType>PT</termType></relation><relation><relationType>BT</relationType><termId>31341269</termId><termName>transmission electron microscopy</termName><termType>PT</termType></relation></term>  </Zthes>