<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31372104</termId><termName>field-emission scanning electron microscopy</termName><termType>PT</termType><termNote><![CDATA[ Scanning electron microscopy performed using a field-emission cathode in the instrument's electron gun, producing clearer, less electrostatically distorted images than conventional SEM.  ]]></termNote><termCreatedDate>2026-03-30 20:40:21</termCreatedDate><relation><relationType>UF</relationType><termId>31372105</termId><termName>FE-SEM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31372106</termId><termName>FESEM</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31372107</termId><termName>field-emission scanning electron microscopy</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31372108</termId><termName>microscopy, field emission scanning electron</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31341265</termId><termName>scanning electron microscopy</termName><termType>PT</termType></relation></term>  </Zthes>