<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31398117</termId><termName>diffractometers</termName><termType>PT</termType><termNote><![CDATA[ Instruments that measure the angles at which x-rays, neutrons, or electrons are diffracted by matter; used to study atomic crystal structure. ]]></termNote><termCreatedDate>2026-03-30 20:47:02</termCreatedDate><relation><relationType>UF</relationType><termId>31398118</termId><termName>diffractometer</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31358233</termId><termName>angle measuring devices</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31317189</termId><termName>diffractometry</termName><termType>PT</termType></relation></term>  </Zthes>