<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31427979</termId><termName>Profilometers (TM)</termName><termType>PT</termType><termNote><![CDATA[ Instruments for measuring the smoothness of surfaces by amplifying minute variations in vertical deviations of the surface. ]]></termNote><termCreatedDate>2026-03-30 20:55:27</termCreatedDate><relation><relationType>UF</relationType><termId>31427980</termId><termName>Profilometer (TM)</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31398128</termId><termName>measuring devices for height</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31317190</termId><termName>profilometry</termName><termType>PT</termType></relation></term>  </Zthes>