<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31443938</termId><termName>scanning electron microscopes</termName><termType>PT</termType><termNote><![CDATA[ Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam. ]]></termNote><termCreatedDate>2026-03-30 20:59:37</termCreatedDate><relation><relationType>UF</relationType><termId>31443939</termId><termName>microscope, scanning electron</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31443940</termId><termName>scanning electron microscope</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31419049</termId><termName>electron microscopes</termName><termType>PT</termType></relation><relation><relationType>RT</relationType><termId>31341265</termId><termName>scanning electron microscopy</termName><termType>PT</termType></relation></term>  </Zthes>