<?xml version="1.0" encoding="utf-8"?><!DOCTYPE Zthes SYSTEM "http://zthes.z3950.org/xml/zthes-05.dtd">  <Zthes><term><termId>31467508</termId><termName>total reflection x-ray fluorescence</termName><termType>PT</termType><termNote><![CDATA[ Surface elemental analysis technique widely used for identification and characterization of pigments in conservation science. It is an x-ray fluorescence technique in which an incident beam strikes a sample below the critical angle of external total reflection for X-rays resulting in nearly total reflection of the excitation beam photons. ]]></termNote><termCreatedDate>2026-03-30 21:05:53</termCreatedDate><relation><relationType>UF</relationType><termId>31467509</termId><termName>TXRF</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31467510</termId><termName>fluorescence, total reflection x-ray</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31467511</termId><termName>total reflection x-ray fluorescence</termName><termType>ND</termType></relation><relation><relationType>UF</relationType><termId>31467512</termId><termName>total reflection x-ray fluorescence spectrometry</termName><termType>ND</termType></relation><relation><relationType>BT</relationType><termId>31453001</termId><termName>x-ray fluorescence</termName><termType>PT</termType></relation></term>  </Zthes>