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atomic force microscopy


Identification code: 300380468



Alternative term/s

  • AFM
  • microscopy, atomic force

Anotations

Scope note:

A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system.

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