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particle-induced x-ray emission


Identification code: 300379539



Alternative term/s

  • particle-induced x-ray emission analysis
  • PIXE
  • proton-induced x-ray emission
  • x-ray emission, particle-induced

Anotations

Scope note:

A technique of elemental analysis in which a small area on a surface is bombarded with charged particles (non-electrons, usually protons) to produce fluorescent X-rays specific to an element. The method is used in conservation science, archaeology, and geology to obtain an elemental map which may guide research regarding dating, provenance and authenticity.

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