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secondary ion mass spectrometry


Identification code: 300390572



Alternative term/s

  • SIMS
  • spectrometry, secondary ion mass

Anotations

Scope note:

A form of mass spectrometry commonly used for surface analysis. When a primary beam of accelerated ions strikes a solid surface, secondary ions are among the elements displaced in a process called sputtering. These ions may be directly studied to gain information about the target material.

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